PD IEC/TR 62396-7:2017 PDF

1   Scope This part of IEC 62396, which is a technical report, describes a process to account for the effects of atmospheric radiation on electronic equipment. Single event effects (SEE) due to atmospheric radiation are one class of possible failure mechanisms that are addressed in the safety and reliability analyses of electronic equipment and associated functions. This document focuses on electronic components, electronic equipment and associated electronic functions. System level analysis is not addressed in this document. This document is intended to describe an approach to accounting for SEE in electronic equipment design, design review, and it can provide aid in the aerospace certification process. This document establishes an example process for assessing electronic components in the atmospheric radiation environment, evaluating for mitigations/protections/utilizations, and addressing the electronic equipment impacts of the SEE. The process is intended to support an SEE analysis for electronic equipment. It does not describe, in detail, methods used to mitigate the effects of SEE in the electronic equipment design.