PD IEC/TR 63133:2017 PDF
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 января 2018 г.
- ICS:
- 31.080.01
- SKU:
- PD IEC/TR 63133:2017
Abstract
What is PD IEC/TR 63133 - Ageing level estimation for semiconductor devices about?
PD IEC/TR 63133 is a technical report that discusses semiconductor devices. PD IEC/TR 63133 specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of the system.
Who is PD IEC/TR 63133 – Ageing level estimation for semiconductor devices for?
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