PD IEC/TS 62132-9:2014 PDF
Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 сентября 2014 г.
- ICS:
- 31.200
- SKU:
- PD IEC/TS 62132-9:2014
Abstract
What is PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC about?
Integrated circuits (IC) are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. PD IEC/TS 62132-9 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit. This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. PD IEC/TS 62132-9 is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In some cases, it is useful to scan not only the IC but also its environment.
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