PD IEC TS 62607-6-26:2025 PDF
Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 декабря 2025 г.
- ICS:
- 07.120
- SKU:
- PD IEC TS 62607-6-26:2025
Abstract
1 Scope This part of IEC TS 62607 establishes a standardized method to determine the mechanical key control characteristics (KCCs)
Young's modulus (or elastic modulus), residual strain, residual stress, and fracture stress
of 2D materials and nanoscale films using the bulge test. The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties.
This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres. This document ensures the characterization of mechanical properties essential for ...
Похожие стандарты
Другие стандарты PD