PD IEC/TS 62607-6-4:2016 PDF
Nanomanufacturing. Key control characteristics - Graphene. Surface conductance measurement using resonant cavity
Nanomanufacturing. Key control characteristics - Graphene. Surface conductance measurement using resonant cavity
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 октября 2016 г.
- ICS:
- 07.030
- SKU:
- PD IEC/TS 62607-6-4:2016
Abstract
What is PD IEC/TS 62607-6-4 – Graphene Surface conductance measurement ?
PD IEC/TS 62607-6-4 is an international standard that focuses on surface conductance measurement using a resonant cavity with graphene and key control characteristic. PD IEC/TS 62607-6-4 establishes a method for determining the surface conductance of twodimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite.
Who is PD IEC/TS 62607-6-4 - Graphene Surface conductance measurement for?
PD IEC/TS 62607-6-4 on graphene surface conductance measurement using a resonant cavity is useful for:
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