Nanotechnology. Reliability assessment - Nano-enabled photovoltaic devices. Stability test
Nanotechnology. Reliability assessment - Nano-enabled photovoltaic devices. Stability test
What is PD IEC TS 62876-2-1 -Nano-enabled photovoltaic (NePV) devices about? The IEC 62876 series covers various aspects of reliability assessment of nanotechnology. PD IEC TS 62876-2-1 is one of the parts in the series and a Technical Specification, that specifies a general stability testing program to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic (NePV) devices. Within the scope of PD IEC TS 62876-2-1 , NePV refers to photovoltaic devices made from nano-sized material entities, involving a combination of organic and inorganic components and hard and soft matter, sometimes including liquid electrolytes, which are combined using low-cost preparation methods mainly by low-temperature solution processing. PD IEC TS 62876-2-1 provides a testing program defined in standardized degradation conditions, methodologies, and data assessment for technologies. The results of these tests define stability under standardized degradation conditions for quantitative evaluation of the stability of new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well. Note: The scope does not include photovoltaic modules, i.e. the final product. It is only intended to test the technology. Who is PD IEC TS 62876-2-1
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