Найдено: 2
Overview IEC 60749-24:2004 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods for semiconductor devices.…
Overview IEC 60749-24:2025 - "Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST" specifies an unbiased Highly Accelerated Stress…