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Overview IEC 60749-42:2014 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods for semiconductor devices,…
Overview IEC 60749-4:2017 defines the Highly Accelerated Stress Test (HAST) - a damp-heat, steady-state test method used to evaluate the reliability of non-hermetic packaged semiconductor devices in…