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Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film…

Overview IEC 62047-6:2009 is an international standard developed by the International Electrotechnical Commission (IEC) for the semiconductor and micro-electromechanical system (MEMS) industries. The…

BS EN IEC 62047-61 Semiconductor devices - Micro-electromechanical systems - Part 61: Evaluation methods of l…

BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems - Part 62: Electrical resistance t…