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Overview IEC 62276:2016 is the international standard that specifies requirements and measuring methods for single crystal wafers used as substrates in surface acoustic wave (SAW) filters and resonat…
Overview IEC 62276:2025 is the latest international standard specifying single crystal wafers used in surface acoustic wave (SAW) device applications. This standard defines the manufacturing specific…
Overview IEC 62276:2012 establishes comprehensive requirements and standardized measuring methods for single crystal wafers used as substrates in surface acoustic wave (SAW) device applications. Issu…