Найдено: 2
Overview IEC 62374:2007 specifies a standardized test method for evaluating the Time Dependent Dielectric Breakdown (TDDB) of gate dielectric films used in semiconductor devices. This international s…
Overview IEC 62374-1:2010 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies the testing methodology for evaluating the reliability of inter-…