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Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-…

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-…

Overview IEC 63616:2025 specifies a non‑destructive method for measuring the conductivity of metal thin films at microwave and millimeter‑wave frequencies using a balanced‑type circular disk resonato…