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Overview ISO 25498:2025 - "Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope" specifies a standardized method…
Overview ISO 25498:2018 - "Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope" specifies a standardized method…
1 Scope This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document ap…