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BS EN ISO 3497:2001

Действующий

Metallic coatings. Measurement of coating thickness. X-ray spectrometric methods.

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ISO 3497:2000

Действующий

Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

Overview ISO 3497:2000 - "Metallic coatings - Measurement of coating thickness - X‑ray spectrometric methods" defines X‑ray spectrometric (XRF) methods for measuring metallic coating thickness. The s…

18 · PDF

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ISO 3497:1976

Отменён

Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

7 · PDF

25 €