SIST EN ISO 12085:2000 PDF

Name: SIST EN ISO 12085:2000 — Geometrical product specification (GPS) - Surface texture: Profile method - Motif parameters (ISO 12085:1996)
SKU: SIST EN ISO 12085:2000
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Geometrical product specification (GPS) - Surface texture: Profile method - Motif parameters (ISO 12085:1996)

Название (английский):

SIST EN ISO 12085:2000

Geometrical product specification (GPS) - Surface texture: Profile method - Motif parameters (ISO 12085:1996)

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 30
Дата публикации:: 1 декабря 2000 г.
ICS:: 17.040.20
Технический комитет:: SS SPL - Technical Board for the general field

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Описание (английский):

Defines terms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator and measuring conditions.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview - EN ISO 12085:1997 / ISO 12085:1996

EN ISO 12085:1997 (ISO 12085:1996) is a Geometrical Product Specification (GPS) standard that defines terms, parameters and an ideal operator for the motif method of surface texture assessment by the profile method. The standard describes how to identify motifs on the primary profile, how to discriminate depths, how to combine motifs, and the measuring conditions required to generate reproducible motif parameters for roughness and waviness.

Key topics and technical requirements

Motif concept: A motif is a portion of the primary profile delimited by peak points; motifs are classified as roughness motifs (length ≤ A) or waviness motifs (derived from the upper envelope line, length ≤ B). A and B are the conventional limits between roughness, waviness and residual form.

Motif parameters: Defined parameters include mean spacing and mean depth of roughness motifs (AR, R), maximum depth (Rx), mean spacing and depth of waviness motifs (AW, W), maximum waviness depth (Wx) and total waviness depth (Wte).

Depth discrimination:

Minimum-depth method - divide the profile into sections (width A/2) and retain peaks whose depth exceeds 5% of the rectangle height.
Maximum-depth method - level extreme peaks using H = Ej + 1.65·σj (Ej: mean motif depth; σj: standard deviation) to reduce influence of isolated high peaks.

Combination algorithm: Four combination conditions (envelope, length, enlargement, similar-depth) are applied iteratively to merge motifs into the largest valid motifs; Annex A specifies a reproducible software method.

Measuring conditions: Measurement conventions reference ISO 3274 and include recommended traversing, evaluation length, stylus tip and a requirement that the primary profile contain at least 150 vertical quantization steps. The ISO 4288 16% acceptance rule applies to motif parameters.

Corrected upper envelope line: Used to identify waviness motifs and as an alternative to filtering (ISO 13565-1) for calculating bearing-related parameters (Rke, Rpke, Rvke).

Applications and users

Practical uses: functional surface characterization, quality control, process capability analysis, acceptance criteria on engineering drawings, and multiprocess surface analysis.

Typical users: metrologists, quality engineers, manufacturing/process engineers, surface-inspection labs, instrument and software developers, and drawing/product-definition specialists.

Related standards

ISO 4287 (surface texture terms/parameters)

ISO 4288 (assessment rules)

ISO 3274 (stylus instruments)

ISO 1302 (drawing indications)

ISO 13565-1/2 (bearing curve / Rk family)

ISO/TR 14638 (GPS context and matrix relation covered in Annex C)

EN ISO 12085 provides a filter-independent motif-based approach-complementary to ISO 4287-focused on motif depth and spacing to better link measured surface features to functional performance.

SIST EN ISO 12085:2000 PDF

Abstract

Похожие стандарты

Overview - EN ISO 12085:1997 / ISO 12085:1996

Key topics and technical requirements

Applications and users

Related standards

Технические детали

ISO 12085:1996

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters

ISO 3274:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of conta…

ISO 4288:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the ass…

ISO 13565-1:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method; Surfaces having stratified functi…

ISO 4287:1997/Amd 1:2009

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface t…

ISO 1302:1992

Technical drawings — Method of indicating surface texture

ISO/TR 14638:1995

Geometrical product specification (GPS) — Masterplan

ISO 12085:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters — Technical Cor…