SIST EN ISO 16610-29:2020 PDF

Overview

EN ISO 16610-29:2020 - Geometrical product specifications (GPS) - Filtration - Part 29: Linear profile filters: Wavelets - specifies the use of biorthogonal wavelets for 1D profile filtration in surface metrology. The standard defines basic terminology, concepts and usage rules for compact‑support biorthogonal wavelets, clarifies discrete wavelet transform (DWT) and multiresolution analysis as applied to profile data, and provides normative definitions for particular wavelet families (cubic prediction and cubic B‑spline) in annexes.

Key topics and requirements

• Scope: Applies to linear profile filters using biorthogonal wavelets; presents terminology and usage for profiles (1D surface texture).
• Wavelet fundamentals: Definitions of mother wavelet, wavelet family, dilation and translation, and the wavelet transform.
• Biorthogonal wavelets: Emphasis on invertible (not necessarily orthogonal) transforms that can provide symmetric wavelets and linear phase, important for preserving profile features.
• Multiresolution analysis (MRA): Decomposition into low‑pass (smoothing) and high‑pass (difference) components; concept of the multiresolution ladder and reconstruction of original profiles.
• Discrete wavelet transform (DWT): Use of integer translations and dyadic (usually power‑of‑2) dilations for practical implementations.
• Filter designation and implementation guidance: Rules for specifying filters based on wavelet families and scale selections.
• Normative annexes:
  • Annex A - Cubic prediction wavelets (requirements)
  • Annex B - Cubic B‑spline wavelets (requirements)
• Informative annexes: Relationship to filtration matrix model (Annex C) and the GPS matrix model (Annex D).

Practical applications and users

EN ISO 16610-29:2020 is intended for professionals involved in surface texture measurement and signal processing of profile data, including:

• Metrologists and calibration laboratories implementing profile filtration methods.
• Quality assurance engineers in manufacturing who analyze roughness and waviness using profilometers.
• Instrument manufacturers developing profilometer hardware and firmware.
• Software developers implementing profile filtration and multiresolution analysis in measurement software.
• Researchers in surface metrology and signal processing applying wavelet‑based filters to profile data.

Typical applications: profile filtering for roughness/waviness separation, multiscale texture analysis, feature extraction in inspection processes, and compliant data processing for GPS‑based specifications.

Related standards

• ISO 16610 series (profile and areal filtration): ISO 16610-1, ISO 16610-20, ISO 16610-22
• GPS framework: ISO 14638, ISO 8015, ISO 14253-1
• Metrology vocabulary: ISO/IEC Guide 99 (VIM)

Keywords: EN ISO 16610-29:2020, wavelets, biorthogonal wavelets, filtration, linear profile filters, GPS, surface texture, profile filtering, multiresolution analysis.