SIST EN ISO 9220:2022 PDF
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 19
- Дата публикации:
- 3 марта 2022 г.
- Издание:
- ISO 9220:2022
- ICS:
- 17.040.20
This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10). NOTE The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.
Abstract
Overview
EN ISO 9220:2022 - Metallic coatings: Scanning electron microscope method specifies a destructive technique for measuring the local thickness of metallic and other inorganic coatings by examination of prepared cross-sections using a scanning electron microscope (SEM). The method is applicable for coating thicknesses up to several millimetres (for very thick coatings, ISO 1463 / light-microscope methods are usually more practical). The lower usable thickness is governed by the achievable measurement uncertainty (see Clause 10). The standard also notes the method can be used for organic layers if they are not damaged by cross-section preparation or by the electron beam.
Key topics and technical requirements
- Principle: Cut, mount, grind and polish a cross-section; capture a calibrated digital SEM image and perform thickness measurements using SEM software or external image-processing tools.
- Instrumentation: Commercial SEMs and calibration tools for the SEM length-measurement function are required.
- Calibration tools (examples from Clause 5.2):
- Stage micrometre or graticule
- Silicon wafer with certified regular pattern (metallic bumps)
- Spherical polymer particles with certified diameters
- Tools should have uncertainty
Технические детали
- Технический комитет
- IPKZ - Protection of metals against corrosion
- SKU
- SIST EN ISO 9220:2022
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