BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans - Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans - Concept of mission profile
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 мая 2023 г.
- ICS:
- 31.080.01
- Технический комитет:
- CENELEC
- SKU:
- BS EN IEC 63287-2:2023
Abstract
1 Scope This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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