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Overview IEC 63287-2:2023, titled "Semiconductor Devices - Guidelines for Reliability Qualification Plans - Part 2: Concept of Mission Profile," is an international standard published by the Internat…
Overview IEC 63287-1:2021 is an international standard published by the International Electrotechnical Commission (IEC) that provides generic guidelines for the reliability qualification of semicondu…
1 Scope This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applica…
1 Scope This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage…