BS IEC 60748-23-2:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification - Internal visual inspection and special tests
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification - Internal visual inspection and special tests
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 21 июня 2002 г.
- ICS:
- 31.200
- SKU:
- BS IEC 60748-23-2:2002
Abstract
What is BS IEC 60748-23-2 - Reference criteria for integrated circuits about?
Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. BS IEC 60748-23-2 is a part of an international multi-series standard that focuses on aspects of integrated circuits for s emiconductor devices .
BS IEC 60748-23-2 applies to high-quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elements used for microelectronic applications including r.f./microwave. BS IEC 60748-23-2 prescribes reference criteria for the establishment, ...
Похожие стандарты
Упомянутые в описании и другие стандарты BS
IEC 60748-23-2:2002
ДействующийSemiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Man…
Overview IEC 60748-23-2:2002 - “Semiconductor devices - Integrated circuits - Part 23-2” defines requirements for manufacturing line certification, focusing on internal visual inspection and special…
BS ISO 10835:2007
ДействующийDirect reduced iron and hot briquetted iron. Sampling and sample preparation.
1 Scope This International Standard gives a) the underlying theory, b) the basic principles for sampling and preparation of samples , and c) the basic requirements for the design, installation and op…