IEC 60747-16-10:2004
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 56
- Дата публикации:
- 15 июля 2004 г.
- Издание:
- IEC IS 60747 edition 1 version 1
- ICS:
- 31.200
IEC 60747-16-10:2004 specifies the terms, definitions, symbols, quality system, test, assessment and verification methods and other requirements relevant to the design, manufacture and supply of monolithic microwave integrated circuits in compliance with the general requirements of the IECQ-CECC System for electronic components of assessed quality.
Abstract
Overview
IEC 60747-16-10:2004 - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (MMICs) - defines the terms, symbols, quality system, test, assessment and verification methods relevant to the design, manufacture and supply of MMICs under the IECQ-CECC Quality Assessment System for Electronic Components. The standard helps manufacturers and certifying bodies demonstrate compliance with the general requirements of the IECQ-CECC system and provides a harmonized framework for technology approval of MMIC processes and products.
Key Topics
- Scope & Definitions: standardized terminology, units and preferred values for MMIC technology.
- Quality System Requirements: alignment with IECQ-CECC procedures and requirements for process control and documentation.
- Technology Flow & Process Control: flow charts and process descriptions covering design, mask manufacture, wafer fabrication, wafer probing, back-side processes, assembly, testing, packaging and shipping.
- Validation & Verification: methods for process validation, equipment and material controls, rework policies, and criteria for release/validity of product shipments.
- Testing & Test Procedures: guidance on MMIC testing, test equipment interfaces, test process boundary verification and product verification.
- Supply Chain Controls: requirements for subcontractor control, vendor interfaces and management of internal suppliers.
- Process Characterization: identification and documentation of key process characteristics and characterization procedures.
- Administration: procedures for technology approval, withdrawal of approval, and references to IEC/ISO directives.
Applications
- Manufacturers of MMICs use IEC 60747-16-10 to document and validate production processes, ensure consistent wafer fabrication, assembly, and testing, and to prepare for IECQ-CECC Technology Approval.
- Quality managers and process engineers employ the TAS to define process controls, validation plans and test verification strategies that support certified supply to international markets.
- Certification bodies, auditors and procurement teams rely on the TAS when assessing vendor capability, approving technologies, or accepting components produced under the IECQ-CECC system.
- Test laboratories use the document to align MMIC measurement procedures and equipment requirements with recognized industry practice.
Practical Benefits
- Facilitates international trade by harmonizing technology approval requirements for MMICs across IECQ-CECC member countries.
- Reduces duplicated testing and expedites market acceptance by providing a clear path for certification and verified manufacturing processes.
- Improves product quality and traceability through standardized process control, validation and documentation.
Related Standards
- IEC 60747 series (Semiconductor devices) - broader semiconductor device standards.
- IEC QC 210000 / IECQ-CECC System - Technology Approval and quality assessment framework referenced by the TAS.
- ISO/IEC Directives (Part 2) - used in drafting and editorial structure.
Технические детали
- Технический комитет
- SC 47E - Discrete semiconductor devices
- SKU
- IEC 60747-16-10:2004
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