IEC 60747-6:2025
Semiconductor devices - Part 6: Discrete devices - Thyristors
Semiconductor devices - Part 6: Discrete devices - Thyristors
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 138
- Дата публикации:
- 30 сентября 2025 г.
- Издание:
- IEC IS 60747 edition 4 version 1
- ICS:
- 31.080.20
IEC 60747-6:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices: - reverse blocking triode thyristors; - reverse conducting (triode) thyristors; - bidirectional triode thyristors (triacs); - turn-off thyristors. If no ambiguity is likely to result, any of the above will be referred to as thyristors. This edition includes the following significant technical changes with respect to the previous edition: a) the terms and definitions for partial thermal resistance junction-to-case and voltages related to ratings and characteristics (properties) have been added; b) Clauses 3, 4, 5, 6 and 7 were amended with some deletions of information no longer in use and with some necessary additions.
Abstract
Overview
IEC 60747-6:2025 - "Semiconductor devices - Part 6: Discrete devices - Thyristors" is the 2025 edition of the IEC product standard that defines terminology, letter symbols, essential ratings and characteristics, measuring and test methods, and requirements for type, routine and endurance tests and marking for discrete thyristor devices. Covered device types include reverse blocking triode thyristors, reverse conducting (triode) thyristors, bidirectional triode thyristors (triacs) and turn-off thyristors. This edition adds definitions for partial thermal resistance (junction-to-case) and clarifies voltage-related ratings, and updates Clauses 3–7 to remove obsolete information and include necessary additions.
Key Topics
- Scope and terminology: standardized definitions for principal voltages, currents, gate quantities and thermal terms.
- Essential ratings & characteristics: storage/operating temperatures, principal voltages and currents, gate ratings, total power dissipation, frequency and mechanical ratings.
- Electrical characteristics: on‑state/off‑state behavior, latching/holding currents, reverse/repetitive peak currents, recovery and turn‑off parameters.
- Thermal properties: thermal resistance, transient thermal impedance, and measurement of case/junction temperatures (including partial thermal resistance junction-to-case).
- Measuring methods & test circuits: detailed procedures and diagrams for verifying non‑repetitive voltages/currents, surge on‑state currents, di/dt and dv/dt limits, recovered charge and recovery times, on‑state voltage measurement and more.
- Test requirements: requirements for type tests, routine tests, endurance/reliability tests and acceptance criteria.
- Marking & documentation: marking requirements to ensure traceability and correct application.
Applications
IEC 60747-6:2025 is essential for professionals involved with power semiconductor selection, design, testing and compliance:
- Semiconductor manufacturers - to specify product datasheets, define production test plans and ensure consistent device ratings.
- Test laboratories - to implement standardized electrical and thermal test methods and provide certification.
- Power electronics designers - to select appropriate thyristors for converters, motor drives, HV switching, AC controllers and protection circuits using defined ratings (di/dt, dv/dt, recovery).
- Quality & reliability engineers - to run endurance and routine tests consistent with international acceptance criteria.
- Procurement & compliance teams - to verify supplier claims and ensure components meet IEC requirements.
Keywords: IEC 60747-6:2025, thyristors, semiconductor devices, discrete devices, triac, turn-off thyristor, thermal resistance, testing methods, ratings and characteristics.
Related Standards
- Other parts of the IEC 60747 series (semiconductor device standards) and related IEC/ISO standards for electrical testing and product safety. Check the IEC webstore or national committees for the latest cross‑references and corrigenda.
Технические детали
- Технический комитет
- SC 47E - Discrete semiconductor devices
- SKU
- IEC 60747-6:2025
Похожие стандарты
Упомянутые в описании и другие стандарты IEC
IEC 60747-5-15:2022
ДействующийSemiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-b…
Overview IEC 60747-5-15:2022 defines a standardized test method to measure the flat‑band voltage (VFB) of single GaN‑based light emitting diode (LED) die or packages (without phosphor) using electror…
IEC 62590-2-2:2026
ДействующийRailway applications - Electronic power converters for fixed installations - Part 2-2: DC Traction applicatio…
Overview IEC 62590-2-2:2026 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on railway applications, specifically the electronic power converter…
IEC 61753-042-02:2026
ДействующийFibre optic interconnecting devices and passive components - Performance standard - Part 042-02: Plug-pigtail…
Overview IEC 61753-042-02:2026 establishes the minimum performance, test, and measurement requirements for plug-pigtail and plug-receptacle style OTDR (Optical Time-Domain Reflectometer) reflecting d…
IEC 61837-2:2018
ДействующийSurface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal le…
Overview IEC 61837-2:2018 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Edition 3.0, 2018…
IEC 61851-23-1:2026
ДействующийElectric vehicle conductive charging system - Part 23-1: DC electric vehicle supply equipment - Automated con…
Overview IEC 61851-23-1:2026 is an international standard published by the International Electrotechnical Commission (IEC) that specifies requirements for DC electric vehicle supply equipment (EVSE)…
IEC 63506:2026
ДействующийCalibration of the prompt fission neutron logging tools
Overview IEC 63506:2026 - Calibration of the Prompt Fission Neutron Logging Tools is the international standard that specifies the calibration methods for prompt fission neutron (PFN) logging tools,…
IEC 63589-1:2026
ДействующийLinear accelerator - Electron linear accelerator for radiation processing - Part 1: General requirements and…
Overview IEC 63589-1:2026 specifies the general requirements and test methods for electron linear accelerator devices used in radiation processing. Developed by the International Electrotechnical Com…
IEC 61837-2:2018/AMD2:2026
ДействующийAmendment 2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines a…
Overview IEC 61837-2:2018/AMD2:2026, published by the International Electrotechnical Commission (IEC), serves as Amendment 2 to the international standard for surface mounted piezoelectric devices us…