IEC 60748-21-1:1997
Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures
Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 29
- Дата публикации:
- 10 апреля 1997 г.
- Издание:
- IEC IS 60748 edition 2 version 1
- ICS:
- 31.200
Abstract
Overview
IEC 60748-21-1:1997 is an international standard published by the International Electrotechnical Commission (IEC) that provides a blank detail specification framework for film integrated circuits and hybrid film integrated circuits. This standard is based on qualification approval procedures and serves as a guideline for preparing detailed specifications for semiconductor devices, particularly integrated circuits (ICs) utilizing film and hybrid film technologies.
The document is part of the IEC’s ongoing efforts to advance semiconductor device standardization and quality assurance, helping manufacturers, designers, and quality assessors align on technical and procedural requirements within the global electronics industry.
Key Topics
-
Scope and Purpose
This standard outlines a framework for creating specific detailed specifications adapted to film and hybrid film integrated circuits. It addresses the conditions, methods, and documentation needed to ensure qualification approval and consistent quality verification. -
Characteristics and Usage Conditions
The standard sets out comprehensive guidelines on the operational and environmental characteristics and user conditions that these film ICs must meet. -
Recommended Mounting Methods
Specifications on how to correctly mount film and hybrid film integrated circuits are given to prevent damage and maintain device integrity during assembly. -
Marking and Identification
Clear marking requirements are defined to ensure traceability and correct identification of integrated circuits throughout manufacturing and supply chains. -
Ordering and Certification Information
Guidance is provided on how ordering instructions and certified lot release records should be communicated to uphold transparency and quality throughout production. -
Inspection and Testing Requirements
Detailed tables and methodologies for lot-by-lot inspections and periodic testing are included. These are grouped under different methods (Method A and Method B) and test categories (Groups A, B, C, and D), covering visual inspection, functional testing, and reliability assessments. -
Additional and Stricter Requirements
The standard allows for customization by incorporating additional or more stringent requirements where necessary, aligned to higher quality or specialized applications. -
Integration with Other IEC Specifications
It complements and works in conjunction with IEC 60748-20 and IEC 60748-21 standards, which cover generic and intermediate specifications for film and hybrid film integrated circuits.
Applications
IEC 60748-21-1:1997 is invaluable for industries and organizations involved in:
-
Semiconductor Device Manufacturing
Standardizes the qualification and approval process for film-based integrated circuits, ensuring enhanced product reliability and performance criteria are met. -
Quality Assurance and Control
Provides a robust framework for quality testing, certification, and inspection of film and hybrid film ICs during various phases of production and delivery. -
Product Design and Engineering
Assists design engineers in understanding the mounting, marking, and use conditions for film ICs, facilitating better integration within electronic systems. -
Supply Chain and Compliance
Enables clearer communication of ordering details and compliance documentation between suppliers and customers, promoting transparency and international acceptance. -
Research and Development
Supports R&D activities by offering structured testing methodologies and qualification criteria that help innovate new film-based semiconductor products.
Related Standards
This standard is closely linked with other IEC documents essential for comprehensive semiconductor device quality management:
-
IEC 60748-20 (Generic Specification for Film Integrated Circuits)
Provides overarching generic requirements and terminology for film and hybrid film ICs. -
IEC 60748-20-1 (Visual Inspection Requirements)
Focuses specifically on internal visual inspection protocols for these ICs. -
IEC 60748-21 (Intermediate Specifications for Film ICs)
Bridges generic and detailed specifications addressing qualification procedures and requirements. -
IEC Quality Assessment System for Electronic Components (IECQ)
The QC number associated with IEC 60748-21-1 ties it to the IEC's electronic components quality assurance system, promoting harmonized quality standards internationally.
Conclusion
IEC 60748-21-1:1997 serves a critical role in the global semiconductor ecosystem by providing a standardized blank detail specification format and qualification framework for film and hybrid film integrated circuits. Its comprehensive guidance on usage conditions, mounting methods, inspection, and certification processes ensures quality, reliability, and interoperability in the manufacturing and deployment of these advanced semiconductor devices.
By adhering to this standard, manufacturers and designers can enhance international cooperation, reduce redundant testing, and ensure that semiconductor film integrated circuits comply with globally recognized quality benchmarks. This leads to increased confidence, improved product life cycles, and enhanced performance for a wide range of electronic applications.
Технические детали
- Технический комитет
- SC 47A - Integrated circuits
- SKU
- IEC 60748-21-1:1997
Похожие стандарты
Упомянутые в описании и другие стандарты IEC
IEC 60748-21:1997
ДействующийSemiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits a…
Overview IEC 60748-21:1997 is an international standard developed by the International Electrotechnical Commission (IEC) specifically for semiconductor devices, focusing on film integrated circuits (…
IEC 62590-2-2:2026
ДействующийRailway applications - Electronic power converters for fixed installations - Part 2-2: DC Traction applicatio…
Overview IEC 62590-2-2:2026 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on railway applications, specifically the electronic power converter…
IEC 61753-042-02:2026
ДействующийFibre optic interconnecting devices and passive components - Performance standard - Part 042-02: Plug-pigtail…
Overview IEC 61753-042-02:2026 establishes the minimum performance, test, and measurement requirements for plug-pigtail and plug-receptacle style OTDR (Optical Time-Domain Reflectometer) reflecting d…
IEC 61837-2:2018
ДействующийSurface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal le…
Overview IEC 61837-2:2018 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Edition 3.0, 2018…
IEC 61851-23-1:2026
ДействующийElectric vehicle conductive charging system - Part 23-1: DC electric vehicle supply equipment - Automated con…
Overview IEC 61851-23-1:2026 is an international standard published by the International Electrotechnical Commission (IEC) that specifies requirements for DC electric vehicle supply equipment (EVSE)…
IEC 63506:2026
ДействующийCalibration of the prompt fission neutron logging tools
Overview IEC 63506:2026 - Calibration of the Prompt Fission Neutron Logging Tools is the international standard that specifies the calibration methods for prompt fission neutron (PFN) logging tools,…
IEC 63589-1:2026
ДействующийLinear accelerator - Electron linear accelerator for radiation processing - Part 1: General requirements and…
Overview IEC 63589-1:2026 specifies the general requirements and test methods for electron linear accelerator devices used in radiation processing. Developed by the International Electrotechnical Com…
IEC 61837-2:2018/AMD2:2026
ДействующийAmendment 2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines a…
Overview IEC 61837-2:2018/AMD2:2026, published by the International Electrotechnical Commission (IEC), serves as Amendment 2 to the international standard for surface mounted piezoelectric devices us…