IEC 61000-4-20:2022
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 229
- Дата публикации:
- 18 февраля 2022 г.
- Издание:
- IEC IS 61000 edition 3 version 1
- ICS:
- 33.100.10
IEC 61000-4-20:2022 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example striplines and electromagnetic pulse simulators) and closed structures (for example TEM cells). These structures can be further classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this document is to describe TEM waveguide characteristics, including typical frequency ranges and equipment-under-test (EUT) size limitations; TEM waveguide validation methods for electromagnetic compatibility (EMC) tests; the EUT (i.e. EUT cabinet and cabling) definition; test set-ups, procedures, and requirements for radiated emission measurements in TEM waveguides; and test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. NOTE Test methods are defined in this document to measure the effects of electromagnetic radiation on equipment and the electromagnetic emissions from the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for the quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate reproducibility of results at various test facilities for qualitative analysis of effects. This document does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this document is to provide a general basic reference for all interested product committees of the IEC. For radiated emission measurements, product committees select emission limits and measurement methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This document describes test methods that are separate from those of IEC 61000‑4‑3. This third edition cancels and replaces the second edition published in 2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: provide information on the testing of large EUTs (including cables); apply the work on measurement uncertainties by adapting the work completed in CISPR and TC 77 (for emissions and immunity); update the validation procedure for the test volume regarding field uniformity and TEM mode verification; provide information concerning two-port and four-port TEM waveguides; add a new informative annex (Annex I) dealing with transient TEM waveguide characterization; and add information dealing with dielectric test stands for EUTs.
Abstract
Overview
IEC 61000-4-20:2022 is an international standard published by the International Electrotechnical Commission (IEC) that establishes testing and measurement techniques related to electromagnetic compatibility (EMC). Specifically, this third edition focuses on emission and immunity testing of electrical and electronic equipment using transverse electromagnetic (TEM) waveguides. It includes measurements in both open (e.g., striplines, electromagnetic pulse simulators) and closed TEM waveguide structures (e.g., TEM cells).
The standard defines procedures for testing the electromagnetic emissions from equipment as well as its immunity to electromagnetic disturbances within controlled TEM environments. This enables reliable assessment of EMC performance to ensure devices function correctly in the presence of electromagnetic interference and do not emit harmful disturbances themselves.
Key Topics
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TEM Waveguide Characteristics: IEC 61000-4-20 describes the various types of TEM waveguides including one-port, two-port, and multi-port structures. It details their frequency ranges, physical size limitations for equipment under test (EUT), and necessary validation methods to confirm test volume and field uniformity.
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Emission Testing: The standard provides detailed guidance on radiated emission measurements inside TEM waveguides, covering test setups, correlation algorithms to relate TEM waveguide voltages to electric field strengths, and correction factors to improve measurement accuracy.
-
Immunity Testing: Procedures for radiated immunity testing of equipment within a TEM waveguide are defined, including test levels, equipment arrangement, test execution, and reporting methodologies to verify an EUT’s resistance to electromagnetic disturbances.
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Large EUT Testing: Updates in this edition expand testing techniques to accommodate large equipment and complex cabling configurations.
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Validation and Uncertainty: The standard integrates approaches to validate test environments and incorporate measurement uncertainty considerations based on CISPR and IEC TC 77 working group efforts.
-
Annexes: Comprehensive normative and informative annexes cover emission and immunity test details, transient HEMP testing, TEM waveguide characterization, probe calibration, and guidelines on reducing instrumentation uncertainty.
Applications
IEC 61000-4-20:2022 is used by EMC testing laboratories, product certification bodies, and manufacturers of electrical and electronic equipment to:
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Conduct EMC Compliance Testing: Verify device compliance with emission limits and immunity criteria using standardized TEM waveguide methods.
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Design Robust Electronic Systems: Help engineers identify susceptibility to electromagnetic interference early in product development to ensure reliable operation in complex electromagnetic environments.
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Support Product Certification: Enable conformity assessment aligned with IEC EMC standards and facilitate regulatory approvals in international markets.
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Optimize Test Facilities: Establish and validate TEM waveguide-based test setups for consistent and reproducible EMC measurements.
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Evaluate Transient Effects: Perform high-energy transient testing such as high-altitude electromagnetic pulse (HEMP) simulations within TEM cells, supporting equipment resilience assessments in harsh electromagnetic conditions.
Related Standards
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IEC 61000-4-3: Details immunity testing using reverberation chambers and other radiated field test environments, complementary to TEM waveguide methods.
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CISPR Standards: Coordinate emission limits and measurement methods across various product categories, harmonizing with IEC 61000-4-20 testing approaches.
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IEC TC 77 Series: The technical committee responsible for electromagnetic compatibility standards, focusing on test methodologies, immunity criteria, and emission limitations.
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IEC 61000 Series: A broader framework covering general EMC requirements, testing techniques, and performance criteria across electrical and electronic technologies.
By following IEC 61000-4-20:2022, stakeholders in electromagnetics can ensure reproducible EMC testing results, maintain high product quality, and meet stringent international compliance requirements. This standard supports the ongoing drive toward safer, more reliable electronic systems in an increasingly interconnected and electromagnetically complex world.
Технические детали
- Технический комитет
- SC 77B - High frequency phenomena
- SKU
- IEC 61000-4-20:2022
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