IEC 61000-4-36:2020
Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems
Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 108
- Дата публикации:
- 23 марта 2020 г.
- Издание:
- IEC IS 61000 edition 2 version 1
- ICS:
- 29.130.10
IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - addition of a hyperband and mesoband radiated transients immunity test method in - Annex H; - addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I.
Abstract
Overview - IEC 61000-4-36:2020 (IEMI immunity test methods)
IEC 61000-4-36:2020 is part of the IEC electromagnetic compatibility (EMC) test and measurement techniques series. It provides standardized methods to determine test levels and procedures for assessing the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. The second edition (2020) is a technical revision of the 2014 edition and adds a hyperband and mesoband radiated transients immunity test method (Annex H) and a calibration and uncertainty method for sensors measuring hyper/mesoband transient fields (Annex I).
Key topics and technical requirements
- IEMI problem definition and source parameters: describes IEMI environments, deployment scenarios and technical capability groupings to support realistic threat models.
- Derivation of test limits and immunity parameters: guidance for deriving applicable test levels and transfer functions from threat descriptions.
- Radiated test methods: procedures using IEMI simulators, reverberation chambers and anechoic/GTEM test setups to generate transient radiated fields.
- Conducted test methods: complex waveform injection (CWI), damped sinusoidal injection (DSI), antenna-port injection and conducted transient tests.
- Pulse and transient characteristics: discussion of pulse widths, failure mechanisms (noise, parameter drift, system upset, component damage) and performance criteria.
- Measurement and calibration: Annex I provides calibration methods for sensors (including D-dot style probes) in TEM waveguides and discusses measurement uncertainty for hyperband/mesoband transient fields.
- Field uniformity and test set-up: requirements for field uniformity assessment, laboratory reference conditions, wiring arrangements and test reporting (Annex H).
- Supporting methods and analysis: transfer function derivation, relevance of immunity data, and margins associated with test methodology.
Practical applications and who uses this standard
IEC 61000-4-36 is intended for organizations and professionals involved in EMC and security resilience, including:
- EMC test laboratories performing IEMI immunity assessments.
- Manufacturers of critical systems (power, transportation, medical, telecoms, industrial control) seeking to evaluate or improve resilience to intentional or high-energy transient threats.
- System integrators and asset owners performing risk assessments and tailored immunity testing.
- Standards committees and security engineers developing threat models or test programs.
Practical outcomes include consistent test methods, repeatable immunity measurements, calibrated sensors for transient fields, and standardized reporting to support system hardening and procurement specifications.
Related standards
- IEC 61000 series (EMC) - general family context
- IEC 61000-2-13 (referenced in Annex B) - published radiated IEMI environments
- IEC 61000-4-20 (referenced in Annex I) - TEM waveguide probe calibration
Keywords: IEC 61000-4-36, IEMI immunity, electromagnetic compatibility, EMC testing, hyperband mesoband, radiated transients, calibration, reverberation chamber, complex waveform injection.
Технические детали
- Технический комитет
- SC 77C - High power transient phenomena
- SKU
- IEC 61000-4-36:2020
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