IEC 61169-39:2009

Overview

IEC 61169-39:2009 is a sectional specification from the International Electrotechnical Commission (IEC) for the CQM series quick‑lock RF connectors. It defines the rules and pro‑forma blank detail specification (DS) used to prepare vendor and product detail specifications for CQM connectors. The standard targets 50 Ω quick‑lock connectors intended for high‑power microwave applications (operating frequency limit at least 4 GHz) used with RF cables and microstrips.

Key Topics

• Detail specification guidance: Rules and a blank DS (pro forma) to standardize how manufacturers document CQM connector variants.
• Mating interface dimensions: Prescribed dimensional data for general‑purpose connectors (Grade 2) and for standard test connectors (Grade 0), supported by figures and tables for reproducible mating and interchangeability.
• Gauging information: Definitions and test sequences for gauges (outer contact and centre contact pins) used to size and verify contacts and retention forces.
• Quality assessment and tests: Selected tests and measuring methods drawn from IEC 61169-1, including acceptance and periodic test schedules and inspection requirements for assessment levels M and H.
• Performance and inspection requirements: Recommended performance characteristics, test severities and inspection procedures to be referenced when writing detail specifications.
• Supplementary material: Illustrative figures and dimensional tables for connectors, gauges and standard test connectors to support manufacturing and test processes.

Applications

IEC 61169-39 is practical for organizations that design, manufacture, test, procure or validate RF connectors:

• Connector manufacturers - to prepare compliant detail specifications, set production tolerances, and demonstrate interchangeability.
• Test laboratories and quality engineers - to apply prescribed gauges, acceptance/periodic tests and quality conformance inspection procedures.
• System integrators and RF designers - to ensure connector choices meet mechanical and electrical mating interface requirements for 50 Ω, up to ≥4 GHz applications.
• Procurement and certification teams - to include standardized DS references in purchase orders and qualification procedures.

Using this standard helps ensure mechanical interchangeability, consistent performance characteristics, and repeatable test/inspection regimes for CQM series quick‑lock RF connectors.

Related Standards

• IEC 61169-1 - Radio‑frequency connectors: Generic specification (general requirements and measuring methods). IEC 61169-39 references tests and procedures from this part.
• Other parts of the IEC 61169 series address additional RF connector families and generic test methods; consult the IEC catalogue for related parts.