IEC 61189-5-503:2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 23
- Дата публикации:
- 22 мая 2017 г.
- Издание:
- IEC IS 61189 edition 1 version 1
- ICS:
- 27.160
IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
Abstract
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