IEC 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 57
- Дата публикации:
- 27 июля 2006 г.
- Издание:
- IEC IS 61967 edition 1 version 1
- ICS:
- 31.200
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements. The contents of the corrigendum 1 of June 2017 have been included in this copy.
Abstract
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