IEC 62047-28:2017
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 17
- Дата публикации:
- 20 января 2017 г.
- Издание:
- IEC IS 62047 edition 1 version 1
- ICS:
- 31.080.99
IEC 62047-28:2017(E) specifies terms and definitions, and a performance testing method of vibration driven MEMS electret energy harvesting devices to determine the characteristic parameters for consumer, industry or any application. This document applies to vibration driven electret energy harvesting devices whose electrodes with a gap below 1 000 μm are covered by dielectric material with trapped charges and are fabricated by MEMS processes such as etching, photolithography or deposition.
Abstract
Overview
IEC 62047-28:2017 defines a performance testing method for vibration‑driven MEMS electret energy harvesting devices. The standard specifies terms, test equipment, measurement procedures and reporting requirements to determine characteristic parameters (voltage, power, frequency/acceleration response) for consumer, industrial and other applications. It applies to MEMS-fabricated electret harvesters whose electrodes (gap < 1 000 μm) are covered by dielectric material with trapped charges, and manufactured by MEMS processes such as etching, photolithography or deposition.
Key Topics and Technical Requirements
- Scope and definitions: Clarifies terms like vibration frequency, vibration acceleration, amplitude and vibration direction specific to electret energy harvesters.
- Test equipment: Describes required blocks - DUT (device under test), vibration exciter, vibration controller, mounting bracket, vibration/acceleration detector, output detector and data recorder.
- Vibration control: Two control approaches allowed - constant amplitude control or constant acceleration control. Vibration direction must be within 2° of the device’s intended direction.
- Measurement accuracy: Output detector and related equipment must measure voltage/power within ±3% error and sample fast enough to capture waveform. Wiring should be short to minimize parasitic capacitance.
- Test conditions:
- Waveform: Sinusoidal vibration.
- Frequency: Constant during each test; frequency sweeps must be slow and include resonant frequency; record sweeps in both directions.
- Acceleration: Constant during testing.
- External load: Use a pure resistor of known value; measure parasitic capacitance of load and detector.
- Testing time & environment: Long enough to stabilize electrical output; specified environmental conditions should be followed.
- Measuring procedures and reporting: Frequency response, acceleration response, external load conditions and full test report requirements are defined. Annex A gives an illustrative measurement example and numerical model.
Applications and Who Uses It
- MEMS designers and device manufacturers: For validating electret harvester performance, optimizing resonant frequency and power output.
- Test laboratories and quality engineers: To perform standardized, repeatable performance tests for product validation and batch testing.
- Research teams and system integrators: For comparing architectures (in‑plane comb drives, patterned electrets) and quantifying usable power under expected vibration conditions.
- Certification bodies and procurement: To verify vendor claims and define acceptance criteria for energy harvesting components used in IoT, low‑power sensors and industrial monitoring.
Related Standards
- Part of the IEC 62047 series on semiconductor MEMS devices. Users should consult other IEC 62047 parts (and device/system specific standards) for complementary testing and terminology.
Keywords: IEC 62047-28, vibration-driven MEMS, electret energy harvesting, performance testing method, vibration exciter, vibration frequency, vibration acceleration, DUT, MEMS fabrication.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC 62047-28:2017
Похожие стандарты
Упомянутые в описании и другие стандарты IEC
IEC 62047-29:2017
ДействующийSemiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method f…
Overview IEC 62047-29:2017 specifies an electromechanical relaxation test method for freestanding conductive thin films under room temperature. The standard defines how to measure time-dependent elec…
IEC 62590-2-2:2026
ДействующийRailway applications - Electronic power converters for fixed installations - Part 2-2: DC Traction applicatio…
Overview IEC 62590-2-2:2026 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on railway applications, specifically the electronic power converter…
IEC 61753-042-02:2026
ДействующийFibre optic interconnecting devices and passive components - Performance standard - Part 042-02: Plug-pigtail…
Overview IEC 61753-042-02:2026 establishes the minimum performance, test, and measurement requirements for plug-pigtail and plug-receptacle style OTDR (Optical Time-Domain Reflectometer) reflecting d…
IEC 61837-2:2018
ДействующийSurface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal le…
Overview IEC 61837-2:2018 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Edition 3.0, 2018…
IEC 61851-23-1:2026
ДействующийElectric vehicle conductive charging system - Part 23-1: DC electric vehicle supply equipment - Automated con…
Overview IEC 61851-23-1:2026 is an international standard published by the International Electrotechnical Commission (IEC) that specifies requirements for DC electric vehicle supply equipment (EVSE)…
IEC 63506:2026
ДействующийCalibration of the prompt fission neutron logging tools
Overview IEC 63506:2026 - Calibration of the Prompt Fission Neutron Logging Tools is the international standard that specifies the calibration methods for prompt fission neutron (PFN) logging tools,…
IEC 63589-1:2026
ДействующийLinear accelerator - Electron linear accelerator for radiation processing - Part 1: General requirements and…
Overview IEC 63589-1:2026 specifies the general requirements and test methods for electron linear accelerator devices used in radiation processing. Developed by the International Electrotechnical Com…
IEC 61837-2:2018/AMD2:2026
ДействующийAmendment 2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines a…
Overview IEC 61837-2:2018/AMD2:2026, published by the International Electrotechnical Commission (IEC), serves as Amendment 2 to the international standard for surface mounted piezoelectric devices us…