IEC 62047-53:2025
Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 14
- Дата публикации:
- 2 октября 2025 г.
- Издание:
- IEC IS 62047 edition 1 version 1
- ICS:
- 31.080.99
IEC 62047-53:2025 defines the test methods for the performances of MEMS electrothermal transfer device. The document is applicable to the MEMS electrothermal transfer devices used in airbags, petroleum and mineral detection, igniters and detonators.
Abstract
Overview
IEC 62047-53:2025 - "Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device" defines standardized test methods for evaluating the performance of MEMS electrothermal transfer devices. This international standard specifies how to measure core performance parameters such as electrical resistance, temperature coefficient of resistance, electrothermal transfer rate, thermal transient response constant, action time and non-destructive current. It is applicable to MEMS electrothermal transfer devices used in airbags, petroleum and mineral detection, igniters and detonators.
Key topics and technical requirements
The standard details required measurements, test setup and reporting items, including:
- Test system components: multimeter, adjustable-temperature heating chamber, capacitor, oscilloscope, pulse constant-current source, infrared temperature sensor and stray-current tester.
- Electrical resistance (R): measurement at room temperature without excitation.
- Temperature coefficient of resistance (β): resistance measured across multiple temperature points and linear least-squares fitting to calculate β.
- Electrothermal transfer rate (δ): ratio of output thermal energy to input electrical energy; measured using capacitor discharge, clamp meter and oscilloscope to capture current and voltage waveforms.
- Thermal transient response constant (α): derived from single-pulse current loading and voltage/time relationship.
- Action time (tr): time to deliver required thermal action to downstream device.
- Non-destructive current (Is): maximum input current that does not exceed non-destructive temperature (≤ 5% resistance change).
- Other tests and characteristics: electrostatic sensitivity, stray current measurement and documentation of essential ratings (operating and storage temperature, mechanical shock, vibration, acceleration, atmospheric conditions).
The standard also prescribes test report contents and includes an informative Annex A with measurement examples and typical diagrams.
Applications and who uses this standard
IEC 62047-53:2025 is intended for:
- MEMS device manufacturers validating design performance and production quality.
- Test laboratories performing qualification, acceptance and reliability testing.
- Automotive safety engineers (airbag initiators) and aerospace/defense teams (igniters, detonators, thrusters).
- Oil, gas and mineral exploration equipment developers using MEMS thermal sensors/initiators.
- Procurement, certification and regulatory bodies that require consistent performance data for safety-critical electrothermal devices.
Using this standard ensures repeatable, comparable measurements of key performance metrics (electrothermal transfer rate, thermal transient response, action time), improving product reliability, safety and interoperability.
Related standards
- IEC 62047 series (Semiconductor devices - Micro-electromechanical devices) - see the IEC webstore for related parts and the latest editions.
- IEC Electropedia and IEC publications pages for terminology and updates.
Технические детали
- Технический комитет
- SC 47F - Micro-electromechanical systems
- SKU
- IEC 62047-53:2025
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