IEC 62132-2:2010

Overview

IEC 62132-2:2010 is an international standard developed by the International Electrotechnical Commission (IEC) for assessing the electromagnetic immunity of integrated circuits (ICs) against radio frequency (RF) radiated electromagnetic disturbances. This part of the IEC 62132 series specifically describes the measurement method using transverse electromagnetic (TEM) cells and wideband TEM (GTEM) cells. This standardized method is essential for ensuring the reliable performance of ICs when exposed to RF disturbances across a frequency range from 150 kHz to 1 GHz, or as determined by the properties of the TEM cell.

The standard outlines equipment requirements, test conditions, and detailed procedures for evaluating IC immunity to RF fields. Adherence to IEC 62132-2 supports improved electromagnetic compatibility (EMC) for IC manufacturers and users, enabling robust design and quality assurance in modern electronic products.

Key Topics

• Measurement Methodology: Describes the use of TEM and GTEM cells for creating repeatable and uniform electromagnetic fields for testing.
• Frequency Range: The method is applicable from 150 kHz up to 1 GHz, depending on the specific characteristics of the TEM or GTEM cell used.
• Test Equipment: Requirements for RF disturbance sources, attenuators, power amplifiers, 50 Ω terminations, and monitoring devices.
• Test Set-up: Details configuration, including the mounting of the IC on an EMC test board that is integrated into the wall port of the cell.
• DUT Orientation: The Device Under Test (DUT) is tested in four orientations to assess susceptibility from different field vectors.
• Field Strength Characterization: Procedures for calibrating the electric and magnetic field strengths inside the TEM cell to ensure accurate and reproducible results.
• Test Reporting: Specifies documentation and reporting requirements to promote consistency of test data.

Applications

IEC 62132-2:2010 is vital for:

• IC Manufacturers: Supports EMC qualification, comparative immunity benchmarking, and design validation.
• Test Laboratories: Provides a repeatable, globally recognized immunity test method for integrated circuits, facilitating regulatory compliance and product certification.
• Electronics Designers: Enables prediction of how ICs will perform in real-world RF environments, helping to identify and mitigate possible EMC issues early in product development.
• Quality Assurance: Ensures product robustness, helps reduce field failures, and supports customer confidence in electronic assemblies.
• Certification and Regulatory Approval: Demonstrates compliance with EMC requirements for products containing integrated circuits, simplifying access to international markets.

The standard applies not only to general ICs, but is also particularly relevant to automotive, industrial, telecommunications, and consumer electronics sectors, where EMC performance is critical.

Related Standards

For comprehensive electromagnetic compatibility assessment and consistent testing, consider these related IEC standards:

• IEC 62132-1: Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions.
• IEC 61967-2: Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method.
• IEC 61000-4-20: Electromagnetic compatibility (EMC) - Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides.

Conclusion

IEC 62132-2:2010 provides a repeatable, reliable standard method for measuring the radiated RF immunity of integrated circuits, supporting global EMC compliance. Using TEM and GTEM cell testing ensures accurate characterizations of IC immunity, aiding industries in producing robust, high-quality electronic systems capable of resisting electromagnetic disturbances. Applying this standard assures end-users and regulators of a product's electromagnetic immunity, thus enhancing market acceptance and operational reliability.