IEC 62396-4:2013

Overview

IEC 62396-4:2013 - Process management for avionics - Atmospheric radiation effects - Part 4 provides guidance for the design of high voltage aircraft electronics (nominally >200 V) to manage atmospheric radiation-induced failures at altitudes up to 60 000 ft (18.3 km). Intended as a complement to IEC 62396-1:2012, this part focuses on the physics, quantification and mitigation of radiation-driven destructive events in high-voltage power semiconductors used in avionics.

Key topics and technical requirements

• Primary failure mechanisms: Describes and distinguishes single event burnout (SEB) and single event gate rupture (SEGR) as the main radiation-induced threats to high voltage MOSFETs, IGBTs, diodes and bipolar power devices.
• Radiation sources and sensitivity: Explains that SEB/SEGR can be triggered by heavy ions, high-energy protons and high-energy/thermal neutrons, and highlights the greater atmospheric neutron flux at flight altitudes vs. sea level.
• Quantification and testing guidance:
  • Methodology for measuring SEB cross-sections and calculating SEB rates for aircraft altitudes.
  • Use of accelerated test data (e.g., spallation neutron facilities such as the WNR beam) and interpretation guidance for avionics.
  • Measurement techniques for event charge/current (EPICS plots and event statistics) and discussion of how stress (applied voltage) affects event rates.
• Design considerations: Guidance for accommodating radiation effects at system and component levels, including conservative operating voltages and device selection strategies.
• Additional topics: Treatment of thermal neutron-induced SEB, potential SEGR from recoil ions, and consideration of alternative semiconductor materials (e.g., non-silicon technologies).

Practical applications and users

Who should use IEC 62396-4:

• Avionics system designers and aircraft electrical architects specifying high-voltage power electronics.
• Electronic equipment and component manufacturers (power MOSFET, IGBT, diode vendors) validating device robustness to atmospheric radiation.
• Aerospace qualification and test engineers conducting radiation testing, failure analysis and mitigation design. Practical uses:
• Standardizing radiation testing approaches and reporting for high-voltage avionics components.
• Informing design margins (operating voltages, protective circuitry) to reduce SEB/SEGR risk.
• Integrating radiation risk assessments into avionics procurement and safety cases.

Related standards

• IEC 62396-1:2012 - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment (required companion document).

Keywords: IEC 62396-4, atmospheric radiation effects, high voltage avionics, single event burnout (SEB), single event gate rupture (SEGR), neutron-induced effects, radiation testing, aircraft electronics, avionics standards.