IEC 62496-2:2017

Overview

IEC 62496-2:2017 - part of the IEC 62496 series - provides general guidance for defining measurement conditions for the optical characteristics of optical circuit boards. The standard specifies a systematic method using code reference look‑up tables to capture source, launch, coupling and capturing conditions. Values from these tables form a Measurement Identification Code (MIC) that documents measurement conditions so independently measured results are reproducible and comparable within an acceptable margin. Recommended measurement conditions are also given to minimise variability.

Key Topics and Requirements

• Measurement definition system - requirements for accuracy, accountability, efficiency, convenience, independence, scalability and customisation to support consistent testing.
• Measurement definition criteria - defined groups of parameters covering:
  • Source characteristics (e.g., wavelength, polarization)
  • Launch conditions (modal profile, fibre or collimated launch)
  • Input coupling conditions (alignment, position, interface details)
  • Output coupling conditions (capture optics, distances)
  • Capturing conditions (detectors, integrating spheres, angular acceptance)
• Measurement Identification Code (MIC) - structured code (e.g., AAA‑BBB‑CCC‑DDD‑EEE) built from coordinate tables to identify exact test conditions.
• Coordinate lookup tables - predefined entries (AAA, BBB, CCC, DDD, EEE) and optional customisation placeholders to standardise reporting.
• Reference measurements and recommended setups to reduce inter-laboratory variation and support traceability.
• Scope of technologies - applies across optical circuit board varieties such as fibre‑optic laminates, polymer waveguides, planar glass waveguides and free‑space optics (see Annex A).

Practical Applications

• Create repeatable, traceable test procedures for R&D and production verification of embedded optical interconnects.
• Standardise test reports and data exchange between suppliers, test labs and system integrators using the MIC.
• Support supplier qualification, acceptance testing and cross‑laboratory comparisons by locking down launch/capture and source parameters.
• Reduce measurement uncertainty and improve interoperability of optical circuit boards in high‑bandwidth systems (backplanes, motherboards, peripheral cards).

Who Should Use This Standard

• Optical circuit board manufacturers and material suppliers
• Test and calibration laboratories validating optical characteristics
• System integrators and OEMs specifying embedded optical interconnect performance
• R&D engineers working on waveguide design, packaging and optical I/O
• Quality & compliance managers implementing measurement traceability

Related Standards

• Other parts of the IEC 62496 series (basic test and measurement procedures for optical circuit boards)
• Standards and guidance from IEC TC 86 (Fibre optics) for optical test methods and terminology

Keywords: IEC 62496-2, optical circuit boards, measurement identification code, MIC, measurement conditions, launch conditions, source characteristics, optical interconnect testing, optical measurement standard.