IEC 62830-1:2017
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 44
- Дата публикации:
- 3 марта 2017 г.
- Издание:
- IEC IS 62830 edition 1 version 1
- ICS:
- 31.080.99
IEC 62830-1:2017 defines terms, definitions, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of vibration based piezoelectric energy harvesting devices for practical use. This document is applicable to energy harvesting devices for consumer, general industries, military and aerospace applications without any limitations on device technology and size.
Abstract
Overview
IEC 62830-1:2017 is an international standard developed by the International Electrotechnical Commission (IEC) that specifically addresses semiconductor devices used for vibration-based piezoelectric energy harvesting. This standard provides comprehensive guidance on terms, definitions, symbols, configurations, and test methods aimed at evaluating the performance characteristics of piezoelectric energy harvesting devices based on mechanical vibrations.
The scope of IEC 62830-1 covers a wide range of practical applications in multiple sectors including consumer electronics, general industry, military, and aerospace. Importantly, there are no restrictions on the device technology or size, making this standard highly versatile for various energy harvesting designs.
Key Topics
-
Terminology and Definitions: The document standardizes general and technical terms related to piezoelectric transducers and energy harvesting parameters, ensuring clear communication and consistency across manufacturers and researchers.
-
Configuration and Symbol Standards: Provides established symbols and configuration guidelines to describe piezoelectric vibration energy harvesters in technical documentation and testing setups.
-
Performance Characteristic Parameters: Defines essential ratings such as capacitance, resonant frequency, bandwidth, output voltage and current, maximum output power, optimal load impedance, settling time, and others critical for device assessment.
-
Test Methods: Details rigorous and standardized test procedures for electrical and mechanical characteristics, including:
- Measurement of capacitance and resonant frequency.
- Evaluation of frequency response and bandwidth.
- Determination of output voltage, current, and power under various load conditions.
- Environmental testing including temperature and humidity ranges.
- Vibration input testing to simulate real-world operational conditions.
-
Reliability and Durability Testing: Guidelines on assessing the reliability of devices through lifetime tests and performance under varying environmental stresses.
Applications
The practical applications of devices compliant with IEC 62830-1 are broad and impactful:
-
Consumer Electronics: Wearable devices, portable electronics, and wireless sensors leveraging vibration energy harvesting to extend battery life or enable battery-free operation.
-
Industrial Automation: Sensors and control elements in factory environments, where ambient vibrations from machinery can be harvested to power wireless sensor networks.
-
Military and Aerospace: Energy harvesting in harsh environments with vibration sources, reducing maintenance needs for remote or mission-critical sensors and equipment.
-
General Energy Harvesting: Integration in autonomous systems requiring sustainable power solutions by converting ambient mechanical vibrations into electrical energy efficiently.
Related Standards
To ensure comprehensive application and compatibility, IEC 62830-1 references several key standards including:
-
IEC 60749-5:2003 – Mechanical and climatic test methods focused on steady-state temperature humidity bias life tests for semiconductor devices.
-
IEC 60749-12:2002 – Mechanical and climatic test methods for semiconductor devices under vibration and variable frequency stressing conditions.
These complementary standards support the validation of device durability and environmental robustness in conjunction with the functional performance testing defined by IEC 62830-1.
Keywords: IEC 62830-1, piezoelectric energy harvesting, vibration based energy harvesting, semiconductor devices, energy harvesting test methods, piezoelectric transducer, resonant frequency, output power, energy harvesting standard, industrial energy harvesting, aerospace energy harvesting.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC 62830-1:2017
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