IEC 62860:2013

Overview

IEC 62860:2013 (also published as IEEE Std 1620‑2008) provides recommended test methods and reporting practices for the electrical characterization of printed and organic transistors and related materials. The standard focuses on measurement design-of-experiment and on minimizing common sources of error-especially those that affect high-impedance electrical measurements required for organic field‑effect transistors (OFETs), printed electronics and flexible electronics. It was developed to support repeatable, comparable results across research labs and manufacturing environments.

Key topics

• Sources of measurement error: identification of common artifacts and error mechanisms specific to organic and printed transistor testing (leakage, contact resistance, noise and parasitic paths).
• High‑impedance measurement practices: recommendations to address challenges unique to OFETs and nanocomposite materials when measuring low currents and high resistances.
• Device structures and test setups: guidance on typical device geometries and how setup choices influence electrical characterization outcomes.
• Standardized reporting: required metadata for published results (environmental conditions, sample size, measurement conditions) to improve repeatability and data comparability.
• Characterization procedures: stepwise guidance for electrical characterization, including transfer/output curve measurement best practices and gating conditions.
• Environmental control: considerations for humidity, temperature and atmospheric effects that can affect organic electronics.
• Data interpretation and documentation: recommended ways to present and report FET parameters for OFETs and organic transistors.

Applications

IEC 62860 is practical for anyone working with organic electronics, including:

• Academic and industrial researchers validating materials and device physics (OFETs, nanotechnology‑based films, nanocomposites).
• Test and metrology laboratories establishing repeatable, high‑impedance measurement procedures.
• Product engineers and manufacturers in printed electronics and flexible electronics aiming to move from lab prototypes to reliable production.
• Material suppliers and device designers who need standardized electrical characterization data for comparison and quality control.

Who should use it

• Researchers developing organic transistor materials and devices
• Metrology and QA teams characterizing OFET performance
• Manufacturers of printed and flexible electronic devices
• Standards bodies and test labs harmonizing measurement protocols

Related standards

• IEC 62860:2013 is published under a dual‑logo agreement as IEEE Std 1620‑2008. It was developed with input from IEC Technical Committee 113 (Nanotechnology standardization for electrical and electronic products and systems).

This standard helps reduce variability in electrical characterization of organic transistors and supports reproducible, comparable data for printed electronics, OFET research, and industrial adoption.