IEC 62899-203-2:2025
Printed electronics - Part 203-2: Materials - Semiconductor ink - Space charge limited mobility measurement in printed organic semiconductive layers
Printed electronics - Part 203-2: Materials - Semiconductor ink - Space charge limited mobility measurement in printed organic semiconductive layers
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 18
- Дата публикации:
- 19 июня 2025 г.
- Издание:
- IEC IS 62899 edition 1 version 1
- ICS:
- 31.180
IEC 62899-203-2:2025 specifies a method to measure the values of effective charge carrier mobility in printed semiconductive layers using space charge limited current (SCLC) mobility technique. The method described is intended to be used as a benchmark test to allow reproducible measurements at a given temperature of the apparent charge carrier mobility for comparison with devices that use different materials, material formulations and fabrication processes for a planar configuration. This document specifies the sample and equipment requirements, and describes the measurement technique, the data analysis procedure and the reporting protocol. This document is suitable to test unipolar devices (i.e. hole-only or electron-only), where charge injection is efficient and where series resistance does not dominate the current-voltage curve. Therefore, it cannot be used for testing high-electron mobility devices where electron injection can be problematic, for testing highly doped materials where space charge limited current does not exist, or to evaluate mobility in applications that require lateral charge transport, such as in transistors.
Abstract
Overview
IEC 62899-203-2:2025 - Printed electronics: Semiconductor ink - Space charge limited mobility measurement in printed organic semiconductive layers specifies a standardized test method to determine the effective charge carrier mobility of printed organic semiconductive layers using the space charge limited current (SCLC) technique. Designed as a reproducible benchmark at a specified temperature for planar devices, the standard defines sample and equipment requirements, the measurement procedure, data-analysis protocol and reporting format to enable consistent comparison between materials, formulations and fabrication processes.
Key topics and requirements
- Scope and limitations
- Intended for unipolar devices (hole-only or electron-only) with efficient charge injection and where series resistance does not dominate the I–V curve.
- Not suitable for devices with problematic electron injection, highly doped materials (no SCLC regime), or applications requiring lateral transport (e.g., transistors).
- Sample and DUT requirements
- Geometry and active area definitions for planar sandwich structures (thin semiconductive layer between parallel electrodes).
- Test equipment and measurement
- Protocol for stepwise voltage sweeps, current settling time, and temperature control to measure the I–V curve for SCLC analysis.
- Data analysis and corrections
- Procedures for series resistance checks, compensation for built‑in voltage, selection of valid data ranges, and least-squares fitting to extract the effective mobility.
- Recording of fit parameters, mobility values at specified electric fields, and fit images for traceability.
- Reporting
- A standardized reporting template and example (Annex A) to ensure reproducible, comparable results across labs.
Applications and users
- Materials R&D teams benchmarking semiconductor inks and printed organic semiconductive layers.
- Ink formulators and manufacturers evaluating formulation changes and process impacts on charge carrier mobility.
- Test laboratories and QA departments performing mobility measurements for product specification and supplier comparison.
- Academic and industrial researchers studying transport properties in printed electronics using the SCLC mobility technique.
Practical value
- Provides a reproducible, widely applicable benchmark for mobility in printed devices, improving comparability across vendors and publications.
- Reduces variability introduced by differing measurement practices and data-analysis methods, enabling better material selection for OLEDs, OPVs and other printed electronic components where vertical transport dominates.
Related standards
- IEC 62899-203 (Printed electronics - Part 203: Materials - Semiconductor ink)
- Other parts of the IEC 62899 series: IEC 62899-201 (Substrates), IEC 62899-202 (Conductive ink), IEC 62899-204 (Insulator ink)
Keywords: IEC 62899-203-2:2025, printed electronics, semiconductor ink, SCLC, space charge limited current, charge carrier mobility, mobility measurement, printed organic semiconductive layers.
Технические детали
- Технический комитет
- TC 119 - Printed Electronics
- SKU
- IEC 62899-203-2:2025
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