IEC PAS 62162:2000
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
- Статус документа:
- D
- Формат:
- Электронный (PDF)
- Количество страниц:
- 7
- Дата публикации:
- 22 августа 2000 г.
- Издание:
- IEC PAS 62162 edition 1 version 1
- ICS:
- 31.080.01
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC PAS 62162:2000
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