IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 27
- Дата публикации:
- 8 февраля 2022 г.
- Издание:
- IEC TS 62607 edition 1 version 1
- ICS:
- 07.120
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic • defect density nD of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by • Raman spectroscopy
Abstract
Overview
IEC TS 62607-6-11:2022 is a technical specification developed by the International Electrotechnical Commission (IEC) that standardizes the method for determining the using . Applicable to both chemical vapor deposition (CVD)-grown graphene films and exfoliated graphene flakes, this standard facilitates reliable characterization and quality control of graphene materials. The defect density, a crucial key control characteristic, directly impacts the material's electronic, mechanical, and physical properties, making precise measurement essential for manufacturers and end-users in nanotechnology and electronics.
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