ISO 3274:1996

Name: ISO 3274:1996 — Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
SKU: ISO 3274:1996
Price: 23400 RUB
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Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments

Название (английский):

ISO 3274:1996

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments

Статус документа:: Отменён
Формат:: Электронный (PDF)
Количество страниц:: 13
Дата публикации:: 5 декабря 1996 г.
Издание:: ISO IS 3274 edition 2 version 1
ICS:: 17.040.30

Тип поставки:

Full version23 400 ₽Read online 24h1 200 ₽Read online 72h1 800 ₽

Язык документа:

ruen

Срок поставки:3 раб. дн. (перевод)

Цена:23 400 ₽

Описание (английский):

Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

ISO 3274:1996 - "Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments" defines the profiles and general structure of contact (stylus) instruments used for measuring surface roughness and waviness. This second-edition GPS standard replaces ISO 3274:1975 and ISO 1880:1979 and sets out the instrument properties that influence profile evaluation, enabling consistent and traceable surface texture measurement with profile meters and profile recorders.

Key topics and technical requirements

Profiles and profile types: Definitions of traced, reference, total, primary and residual profiles that form the basis for profile evaluation.

Stylus instrument architecture: Measurement loop, reference guide, drive unit, probe (pick-up), tracing element and stylus tip (nominally conical with a spherical tip).

Metrological characteristics: Static and dynamic measuring forces, hysteresis, probe linearity deviation, measuring range, quantization (ADC) step, range-to-resolution ratio, and transmission function for sine waves.

Profile transmission and filtering: Short-wave transmission limitation, vertical and horizontal profile transmission characteristics, and the requirement for phase-correct filtering (modern instruments use filters compliant with ISO 11562).

Instrument outputs: Digital storage, data input/output, profile recording and parameter calculation for roughness and waviness according to GPS procedures.

Practical considerations: Influence of guide deviations, measurement loop disturbances, and the effect of analog 2RC filters (historical) on phase shifts and certain parameters.

Applications

Specifying and selecting stylus instruments (profile meters/recorders) for production quality control and laboratory metrology.

Defining instrument characteristics that affect surface roughness and waviness measurement accuracy.

Providing a common basis for instrument makers, calibration laboratories and users to assess conformity and measurement capability.

Supporting digital profile processing and parameter calculation in compliance with GPS profile-method standards.

Related standards

ISO 4287 & ISO 4288 (surface texture terms and assessment rules)

ISO 11562 (phase-correct filters)

ISO 5436 (calibration specimens for stylus instruments)

ISO 12085 and ISO 13565 series (profile parameter and characterization methods)

ISO 3274 is a foundational GPS document for anyone working with contact profilometry, helping ensure consistent, accurate surface texture measurement across instruments and applications.

ISO 3274:1996

Abstract

Похожие стандарты

Overview

Key topics and technical requirements

Applications

Who should use this standard

Related standards

Технические детали

ISO 3274:1975

Instruments for the measurement of surface roughness by the profile method — Contact (stylus) instruments of…

ISO 1880:1979

Instruments for the measurement of surface roughness by the profile method — Contact (stylus) instruments of…

BS EN ISO 11562:1997

Geometrical product specifications (GPS). Surface texture: Profile method. Metrological characteristics of ph…

ISO 4287:1997

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface t…

BS EN ISO 4288:1998

Geometric product specification (GPS). Surface texture. Profile method: Rules and procedures for the assessme…

BS EN ISO 5436-1:2001

Geometrical Product Specifications (GPS). Surface texture: Profile method; Measurement standards - Geometric…

BS EN ISO 12085:1997

Geometrical product specification (GPS). Surface texture. Profile method. Motif parameters.

BS EN ISO 13565-3:2000

Geometric product specifications (GPS). Surface texture: Profile method. Surfaces having stratified functiona…