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Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy
Electrical installations in ships - Part 353: Power cables for rated voltages 1 kV and 3 kV
Application integration at electric utilities - System interfaces for distribution management - Part 100: Implementation profiles
Junction boxes for photovoltaic modules - Safety requirements and tests
Dependability management - Part 3-16: Application guide - Guidelines for specification of maintenance support services
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Live working - Protective clothing against the thermal hazards of an electric arc - Part 1-1: Test methods - Method 1: Determination of the arc rating (ELIM, ATPV and/or EBT) of clothing materials and of protective clot…
Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices
The rH index in aqueous and aqueous-organic media
Reliability of fibre optic interconnecting devices and passive optical components - Part 7: Life stress modeling
Video cameras (PAL/SECAM/NTSC) - Methods of measurement - Part 2: Two- and three-sensor professional cameras
Radio-frequency connectors - Part 52: Sectional specification for series MMCX RF coaxial connectors
Video surveillance systems for use in security applications - Part 2-31: Live streaming and control based on web services
Industrial communication networks - Fieldbus specifications - Part 5-20: Application layer service definition - Type 20 elements
Fire hazard testing - Part 1-20: Guidance for assessing the fire hazard of electrotechnical products - Ignitability - General guidance
Nanomanufacturing - Key control characteristics - Part 6-9: Graphene-based material - Sheet resistance: Eddy current method
Radio-frequency connectors - Part 1-2: Electrical test methods - Insertion loss
Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
Connectors with assessed quality for use in d.c., low-frequencyanalogue and in digital high speed data applications - Part 4:Printed board connectors - Section 102: Detail specification fortwo-part single-pole connector…