EN ISO 3497:2000 PDF
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods (ISO 3497:2000)
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods (ISO 3497:2000)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 20
- Дата публикации:
- 15 декабря 2000 г.
- Издание:
- CEN EN 3497 edition 1 version 1
- ICS:
- 25.220.40
Migrated from Progress Sheet (TC Comment) (2000-07-10): Under revision in ISO - PQ postponed. ++ this document must be processed in // with ISO 3497:1986 rev 5.1 . Resolution of ++ TC to be receivedwithin the month(glg-97-03-21) ++ N 201: New TD (980917)
Abstract
Overview
specifies X‑ray spectrometric methods for measuring the thickness of . It covers both wavelength‑ and energy‑dispersive X‑ray fluorescence (XRF) techniques that determine coating mass per unit area (and, with a known density, linear thickness). The standard describes principles of operation, apparatus, calibration, measurement procedures, factors affecting results and reporting. Note: radiation safety and personnel protection are not covered and must follow national/international regulations.
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