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Overview IEC 60749-34:2010 is an essential international standard developed by the International Electrotechnical Commission (IEC) that specifies the power cycling test methods for semiconductor devi…
Overview IEC 60749-34-1:2025 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies a power cycling test method for power semiconductor modules.…
1 Scope This part of IEC 60749 describes a test method that is used to determine the capability of power semiconductor modules to withstand thermal and mechanical stress resulting from cycling the po…