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Overview IEC 60749-15:2020 - Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through‑hole mounted devices - defines a reproducible sold…
Overview IEC 60749-15:2010 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods to evaluate the resistance…
What is BS EN IEC 60749 ‑ 15 about? BS EN IEC 60749 ‑ 15 is the 15th part of Semiconductor devices in multi-series. BS EN IEC 60749 ‑ 15 describes a test used to determine whether encapsulated solid…