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Overview IEC 60749-30:2020 - "Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non‑hermetic surface mount devices prior to reliability testing" - defines a s…
What is BS EN IEC 60749 ‑ 30 about? BS EN IEC 60749 ‑ 30 is the 30th part of the multimerise Internation standard on semiconductor devices. BS EN IEC 60749 ‑ 30 establishes a standard procedure for d…