Найдено: 2
Overview IEC 60749-5:2017 specifies a steady‑state temperature and humidity bias life test for evaluating the reliability of non‑hermetic packaged solid‑state (semiconductor) devices in humid environ…
Overview IEC 60749-5:2023 - "Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady‑state temperature humidity bias life test" specifies a destructive, steady‑state temperature…