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Overview IEC 63068-2:2019 specifies a non-destructive optical inspection test method for detecting as-grown defects in commercially available 4H‑SiC homoepitaxial wafers used for power devices. Part…
What is BS IEC 63068 ‑ 2 - Silicon carbide homoepitaxial (SiC) wafer about? BS IEC 63068 is a series of international standards for semiconductor devices that specifies the defects in silicon carbide…