SIST EN ISO 13383-2:2016 PDF
Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 2: Determination of phase volume fraction by evaluation of micrographs (ISO 13383-2:2012)
Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 2: Determination of phase volume fraction by evaluation of micrographs (ISO 13383-2:2012)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 19
- Дата публикации:
- 17 мая 2016 г.
- ICS:
- 81.060.30
- Технический комитет:
- I13 - Imaginarni 13
ISO 13383-2:2012 specifies a manual method of making measurements for the determination of the volume fraction of major phases in fine ceramics (advanced ceramics, advanced technical ceramics) using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase. The method applies to ceramics with one or more distinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC, or Al2O3/SiCw. If the test material contains discrete pores, these are to be treated as a secondary phase for the purpose of this method, provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.
Abstract
Overview
EN ISO 13383-2:2016 (ISO 13383-2:2012) defines a manual stereological method for microstructural characterization of fine ceramics (advanced/technical ceramics). The standard specifies how to determine the phase volume fraction by evaluating micrographs of polished and etched sections. The technique uses a transparent square grid overlaid on micrographs and counts grid-line intersections that lie on each identifiable phase to estimate area (and thus volume) fractions.
Key topics and requirements
- Scope and assumptions
- Applies to ceramics with distinct secondary phases (examples: Al2O3/ZrO2, Si/SiC, Al2O3/SiCw).
- Assumes area fractions on random cross-sections represent true phase volume fractions (stereological principle).
- Sample preparation
- Sectioning, mounting, grinding and polishing of test pieces; etching to reveal phases.
- Care to avoid grain pluck‑out that could be confused with pores.
- Imaging and measurement
- Use of optical microscopy or scanning electron microscopy (SEM) with photomicrography.
- Overlay transparent square grid (line thickness ≤ 0.1 mm) and count intersections per phase (grid-intersection method).
- Typical practice uses multiple micrographs (a minimum is indicated; more images improve statistical reliability).
- Limits and uncertainties
- Porosity: if > ~20 % porosity, polishing damage may bias results.
- Small phase fractions (
Технические детали
- SKU
- SIST EN ISO 13383-2:2016
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