IEC 60747-15:2010

Overview

IEC 60747-15:2010 is an international standard developed by the International Electrotechnical Commission (IEC) specifying the requirements for isolated power semiconductor devices. These devices are discrete semiconductor components designed with electrical isolation features that separate the power circuitry from the mounting or base, enhancing safety and performance in various electrical applications. Importantly, this standard excludes devices with incorporated control circuits and serves as an extension to the general requirements presented in other parts of IEC 60747 for non-isolated power devices.

The standard focuses on additional specifications that ensure isolated power semiconductor devices meet rigorous performance, reliability, and safety criteria. It includes updated measurement methods and technical revisions improving upon the previous edition, making it a critical reference for manufacturers, designers, and quality assurance professionals working in power electronics.

Key Topics

• Scope and Application
  Defines requirements specifically for isolated power semiconductor devices, providing supplemental guidelines beyond those for non-isolated devices.

• Terms and Definitions
  Establishes a clear vocabulary relevant to isolated power semiconductor devices for uniform understanding.

• Essential Ratings and Characteristics
  Details critical device parameters including:

  • Isolation voltage rating (Visol)
  • Peak case non-rupture current
  • Terminal current ratings
  • Total power dissipation
  • Temperature and mechanical ratings
  • Parasitic inductance and capacitance
  • Thermal resistance and transient thermal impedance

• Measurement Methods
  Clear procedures are defined to verify essential device characteristics, such as:

  • Isolation voltage testing and breakdown withstand voltage
  • Measurement of partial discharge inception/extinction voltages
  • Parasitic inductance and capacitance measurement techniques
  • Thermal characteristic assessment techniques

• Acceptance and Reliability Testing
  Comprehensive endurance and type testing frameworks ensure devices meet durability and safety standards under expected operating conditions.

• Technical Updates
  The 2010 edition restructured clauses on terms, letter symbols, essential ratings, and measurement methods, optimizing clarity and practicality.

Applications

IEC 60747-15:2010 applies primarily to isolated power semiconductor devices used in:

• Power conversion systems such as inverters, converters, and power supplies where electrical isolation is critical.
• Industrial automation equipment requiring robust and isolated power switching to protect system components and personnel.
• Renewable energy systems like solar inverters and wind turbine controls which incorporate isolated power semiconductor devices.
• Consumer electronics featuring isolated power modules for enhanced safety and performance.
• Automotive electronics, especially in electric and hybrid vehicles needing reliable isolated power switching devices.

By following this standard, manufacturers ensure their isolated power semiconductor devices exhibit reliable electrical isolation, withstand high voltage stresses, and maintain mechanical integrity under demanding environmental conditions.

Related Standards

• IEC 60747-1:2006 – Semiconductor devices – Part 1: General requirements applicable to all semiconductor devices.
• IEC 60747-2, 6, 7, 8, 9 – Related parts specifying requirements for rectifier diodes, thyristors, bipolar transistors, field-effect transistors, and insulated-gate bipolar transistors (IGBTs), respectively.
• IEC 60664-1:2007 – Insulation coordination principles for equipment within low-voltage systems.
• IEC 60270 – High-voltage test techniques for partial discharge measurements essential to verifying insulation integrity.
• IEC 60749 series – Mechanical and climatic test methods related to temperature, humidity, mechanical shock, vibration, and soldering conditions for semiconductor devices.

These related IEC standards provide a comprehensive framework for design, testing, and quality assurance of isolated and non-isolated power semiconductor devices, enabling harmonized global manufacturing and interoperability.

Keywords: IEC 60747-15, isolated power semiconductor devices, power semiconductors standards, electrical isolation, semiconductor device ratings, partial discharge measurement, thermal impedance, power semiconductor reliability, IEC standards for semiconductors