IEC 60749-28:2017

Overview

IEC 60749-28:2017 - "Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level" defines a standardized procedure for testing, evaluating and classifying the susceptibility of semiconductor devices to Charged Device Model (CDM) electrostatic discharge. The document specifies a reproducible, field‑induced (FI) CDM method at device level (with a direct contact DC method described in Annex I), and applies to packaged semiconductor devices, thin‑film circuits, SAW and opto‑electronic devices, hybrid ICs and multi‑chip modules.

Key topics and requirements

• Scope of applicability: All packaged semiconductor devices, thin film circuits, SAW devices, opto‑electronic devices, HICs and MCMs assembled into final‑like packages. The CDM procedure does not apply to socketed discharge model testers.
• Test methods: Primary field‑induced (FI) CDM method; alternative direct contact (DC) CDM method described in Annex I.
• Required equipment: CDM ESD tester components including current‑sensing element, ground plane, field plate and dielectric, charging resistor; high‑bandwidth waveform measurement instruments; verification modules (metal discs); capacitance meter and ohmmeter.
• Waveform verification & tester qualification: Procedures for periodic qualification/requalification, waveform capture, quarterly and routine verification to ensure inter‑tester repeatability. Includes guidance for oscilloscope setup and correlation between 1 GHz and higher‑bandwidth measurements.
• Test execution and reporting: Device handling, test temperature and humidity considerations, discharge procedures (single/dual), recording/reporting guidelines and waveform characteristics.
• Classification: Criteria for classifying CDM ESD sensitivity levels to enable consistent comparisons across devices and test setups.

Applications and who uses it

IEC 60749-28 is used by:

• Semiconductor design and test engineers performing CDM ESD qualification.
• Reliability and quality assurance teams defining ESD sensitivity limits.
• Test laboratories and manufacturers implementing CDM test programs.
• ESD program managers and compliance auditors ensuring repeatable, cross‑tester CDM data.

Practical applications include device qualification for manufacturing release, failure analysis of ESD‑related damage, supplier audits, and establishing device handling/board‑level protection strategies based on CDM sensitivity classifications.

Related standards

• IEC 60749-28 is part of the IEC 60749 family covering mechanical and climatic test methods for semiconductor devices.
• Annex I offers the direct contact (DC) CDM alternative; other ESD and semiconductor test standards are typically referenced for broader ESD program alignment (consult national and industry ESD guidance for integration).

Keywords: IEC 60749-28, CDM, Charged Device Model, ESD sensitivity testing, field-induced CDM, semiconductor device testing, waveform verification, tester qualification.