IEC 61788-7:2006
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 32
- Дата публикации:
- 25 октября 2006 г.
- Издание:
- IEC IS 61788 edition 2 version 1
- ICS:
- 17.220.20
IEC 61788-7:2006 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows: - Frequency: 8 GHz - Measurement resolution: 0,01 milliohm at 10 GHz.
Abstract
Overview
IEC 61788-7:2006 - Superconductivity Part 7 - defines a standardized laboratory method to measure the surface resistance (Rs) of superconducting materials at microwave frequencies. The standard specifies the two‑resonator (dielectric resonator) technique to determine the temperature dependence of Rs at a resonant frequency, with practical measurement coverage in the microwave band and high sensitivity (example resolution: 0.01 milliohm at 10 GHz). The publication also updates recommendations for resonator designs (including closed‑type resonators) and includes guidance on sapphire dielectric rods commonly used for high‑precision measurements.
Key topics and technical requirements
- Measurement method: Standard two‑resonator dielectric resonator approach to extract Rs from resonator Q‑values and insertion loss.
- Temperature dependence: Procedures for measuring Rs(T) over cryogenic to elevated temperatures (cryocooler setups are illustrated).
- Apparatus and components:
- Dielectric resonators (sapphire rods recommended), resonator geometries (closed‑type favored for stability).
- Vector Network Analyzer (VNA) specifications and calibration/measurement procedures.
- Sample holders, specimen preparation and mounting to avoid measurement artifacts.
- Measurement procedure: Setup, reference‑level measurement, frequency response capture, and calculation steps to determine Rs and dielectric parameters (ε′ and tan δ of standard rods).
- Precision, accuracy and reporting: Uncertainty sources (temperature control, sample support, instrument specs), resolution limits, and required information for a compliant test report.
- Recommended measurement frequencies: Examples and design tables in the standard include microwave bands (the standard adds recommended frequencies such as 12 GHz, 18 GHz and 22 GHz in addition to specified microwave ranges).
Applications and who uses it
IEC 61788-7 is intended for:
- Materials scientists and thin‑film researchers characterizing high‑Tc and low‑Tc superconducting films.
- Microwave and RF engineers designing low‑loss filters, resonators, antennas and delay lines that use superconducting films.
- Test laboratories and QA/qualification teams requiring repeatable, traceable Rs measurements for production control.
- Component manufacturers and R&D organizations developing HTS-based telecom or sensing products.
Practical uses include material selection, process optimization for epitaxial films, component loss budgeting, and acceptance testing of superconducting microwave components.
Related standards
- Other parts of the IEC 61788 series covering critical current, residual resistance ratio, AC loss and mechanical tests (e.g., Parts 1–6, 8–13) - useful when a complete superconducting material characterization program is required.
Keywords: IEC 61788-7, surface resistance, superconductors, microwave measurements, dielectric resonator, sapphire resonator, two-resonator method, Rs(T), vector network analyzer, cryocooler.
Технические детали
- Технический комитет
- TC 90 - Superconductivity
- SKU
- IEC 61788-7:2006
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